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IEEE AITest 2024
The 6th IEEE International Conference on Artificial Intelligence Testing
July 15-18, 2024 | Shanghai, China

Scope

IEEE AITest 2024 conference is the sixth edition of a serious IEEE conference with focus on the synergy of AI and software testing. The first IEEE AITest conference took place in April 2019 at New York City, CA, USA. The second and third took place in August 2020 and 2021, respectively, both online due to the COVID-19 pandemic. The fourth took place in August 2022 in the San Francisco Bay Area. While the fifth took place in July 2023 at Athens, Greece. This years’ conference is scheduled to take place in Shanghai, China, from 15-18 July 2024. The conference is part of IEEE CISOSE 2024 congress.

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IEEE AITest 2024 Announcements

We are pleased to announce that the inform you that a special issue “AI Test” of Electronics, MDPI (Impact factor = 2.690) has been released. The special is now open for submission. All the papers accepted by IEEE AI Test 2024 are encouraged to submit an extended version to this special issue. 

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